Fix for multiple test functions

src/AnalogIn.cpp

@@ -89,7 +89,7 @@ AnalogIn::~AnalogIn() {
 	// TODO Auto-generated destructor stub
 }
 
-int test(){
+int test_AnalogIn(){
 	MuxSetup mux;
 	double a1val, a2val;
 

src/DigitalOut.cpp

@@ -53,7 +53,7 @@ DigitalOut::~DigitalOut() {
     pin->write(0);
 }
 
-int test(){
+int test_DigitalOut(){
 	DigitalOut dO1(1);
 	DigitalOut dO2(2);
 	DigitalOut dO3(3);